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SELPA - Scanning ELectron Microscope for Particle Analysis,SELPA - Scanning ELectron Microscope for Particle Analysis
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SEM PRODUCT
SELPA - Scanning ELectron Microscope for Particle Analysis
ID:SELPA

SELPA(Scanning ELectron Microscope for Particle Analysis) is an automated large area particle analyzer, which is developed based on SEM(Scanning Electron Microscope)

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  • Application
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Description

SELPA(Scanning ELectron Microscope for Particle Analysis) is an automated large area particle analyzer, which is developed based on SEM(Scanning Electron Microscope)

In industrial application, it can be used to analyze and classify the particles by their various size and element, the strength of SELPA is that the large area mapping is possible. Also, SELPA can analyze particles under 2.5um, it's a SEM/EDS automated system which can get the results of elements distribution of selected area.

 

Applications

- Cleanliness Test

- Steel Inclusion Test 

- GSR (Gun Shot Residue) Analysis

- Mineral, Asbestos Analysis

- Particle Analysis 

OTHER PRODUCTS

Ion Sputter Coater

ID: SPT-20

SCAN ELECTRON MICROSCOPE COXEM - EM-30N

ID: EM-30N

SCAN ELECTRON MICROSCOPE CX-200Plus Full-size SEM

ID: CX-200Plus

Cross Section Polisher - CP-8000

ID: CP-8000
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