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FPD/LSI Inspection Microscopes ECLIPSE L200 Series,
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Featured news
Industrial Microscopes
FPD/LSI Inspection Microscopes ECLIPSE L200 Series
ID:Nikon L200N/L200LD

Semiconductor LSI/FPD inspection microscope

- High brightness reflected transmission lighting

 

- High-magnification high-resolution sample observation

 

- Motorizing system

Hotline
  • Application
  • Specifications

Semiconductor LSI, FPD inspection large microscope

Enhanced observational performance, environmental responsiveness, and compatibility

Line-up configuration with four types optimized for FPD/LSI inspection

Microscope Stage

 L200N / 200ND Stage

- Distance: 200 x 200mm (8" x 8") (6 inch / 8 inch wafer)

 L300N / 300ND Stage

- Distance: 350 x 300mm (14" x 12")(12-inch wafer-compatible)

Objective: CFI60-2

- High NA and long operating distance

- Various lenses of 1x, 2.5x, 5x, 10x, 20x, 50x, 100x, 150x

- Improvement of chromatic aberration correction

Improving environmental response and operability

High brightness 12V50W halogen lighting with brightness over 12V100W

- Uses approximately 1/2 of the power consumption compared to 12V100W and achieves an equal brightness

- Free centering lamphouse adoption makes lamp replacement easy

- Back mirror mounted on lamphouse, achieving more than 20% brightness compared to 12V100W lighting

- Prevents un-focus ingress by heat

Electric revolver nosepiece for three times the durability of conventional

- Can be equipped with 6 objectives

- Three centering correction mechanisms are installed

- In combination with an eccentric objective

- Low magnification to high magnification switch ing centering error is small, making it easy to use

- The light is automatically turned off during the scale switch, protecting the worker's vision due to scattered light

 

Anti-static coating resistant to contamination

 

- Anti-static coating for body, stage, hard pain, etc.

 

- Strengthening pollution measures

 

- Prevents sample damage due to static electricity

 

3 eye heads tilting formulations that can be observed at optimum eye level

 

- Ultra wide field of view type of 25mm, tilting angle 30º

 

- Adjust the Eye-Level to fit the operator's height for comfortable observation

 

 

 

 

Positioning the stage differential handle

 

- Regardless of the sample observation position, the differential handle position can be adjusted without changing, making operation easy

 

- All the operating unit positions are close, making it easy to focus and move the stage. 

 

 

 

 

 

Built-in Focus-Target for easy focus

 

By inserting the Focus-Target into the optical field, you can quickly and easily focus on samples that do not have patterns such as bear wafers.                               

 

Place the control unit in the center of the front of the body

 

- All operations such as stage handles, focus handles, and scale-switch buttons are placed on the front of the microscope

 

- Design design minimizes operator fatigue during long-term use

 

Support for a variety of observations

 
 

Specifications

ECLIPSE L200N
(Episcopic illumination type)
ECLIPSE L200ND
(Diascopic/Episcopic illumination type)
Main body 12V-50W halogen lamp light source built in; power sources for motorized control built in 
Motorized control for nosepiece, light intensity control, aperture diaphragm control 
Nosepiece: Motorized universal sextuple nosepiece
Epi/Dia changeover
Focusing mechanism Cross travel: 29 mm
Coarse: 12.7 mm per rotation (torque adjustable, refocusing mechanism provided)
Fine: 0.1 mm per rotation (in 1 µm increments)
Episcopic illuminator 12V-50W halogen lamp light source built in
Motorized aperture diaphragm (centerable), Fixed field diaphragm (with focus target)
Pinhole slider (optional), Four ø25 mm filters (NCB11, ND16, ND4), Polarizer and Analyzer can be mounted
Diascopic illuminator 12V-50W halogen lamp light source built in
Aperture diaphragm built in
LWD condenser built in
Interface USB x 1, RS232C (for Intensilight) x 1
Eyepiece tubes L2-TT2A ultrawidefield erect-image tilting trinocular eyepiece tube (tilt angle: 0-30 °) FOV: 22/25; Beamsplit ratio 100:0/20:80
L2-TTA ultrawidefield erect-image tilting trinocular eyepiece tube (tilt angle: 0-30 °) FOV: 22/25; Beamsplit ratio 100:0/0:100
LV-TI3 Trinocular (erect image, FOV: 22/25)
Eyepieces CFI eyepiece lens series
Objectives CFI LU/L Plan series
Stages L2-S8A 8 x 8 stage, stroke: 205 x 205 mm (diascopic observation range: 150 x 150 mm)
Coarse/Fine-movement changeover possible
Fixed-position X-Y fine-movement controls
Antistatic mechanism 1000-10 V, within 0.2 sec
Power consumption 1.2 A/90 W
Dimensions Approx. 360 (W) x 860 (D) x 580 (H) mm (at tilt angle 10 °)
Weight Approx. 45 kg (When L2-S8A 8 x 8 stage and L2-TTA eyepiece tube are used)
OTHER PRODUCTS

Industrial Microscopes ECLIPSE LV100 Series

ID: Nikon LV100ND / LV100NDA

Industrial Microscopes ECLIPSE LV150 Series

ID: Nikon LV150N / LV150NA

Inverted Metallurgical Microscope ECLIPSE MA100

ID: Nikon MA100

Inverted Metallurgical Microscope ECLIPSE MA200

ID: Nikon MA200

FPD/LSI Inspection Microscopes ECLIPSE L300 Series

ID: Nikon L300N / L300ND
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Tư vấn bán hàng
Mr Na In Kang - Korean Manager
Mr Na In Kang - Korean Manager 083.325.1049
Mr Lee Mu Seok - KOREA MANAGER
Mr Lee Mu Seok - KOREA MANAGER 038.313.1048
Mr Khương - Sales Manager
Mr Khương - Sales Manager 086.830.3137
Mr Phúc - Sales Executive
Mr Phúc - Sales Executive 096.815.1813
Mr Huấn - Technical support
Mr Huấn - Technical support 097.917.5569
Mr Thưởng - Sales Excutive
Mr Thưởng - Sales Excutive 097.832.6569
Mr Ngọc - Technical Support
Mr Ngọc - Technical Support 096.776.1171
Mr Tâm - Technical Support
Mr Tâm - Technical Support 086.239.6388
 

 

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