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Featured news
Kính hiển vi kim tương Nikon
Kính hiển vi công nghiệp Nikon ECLIPSE L200N/L200LD
ID:ECLIPSE L200N/L200LD

ECLIPSE L200N/L200LD

Enhanced observation, durability and operational performance, combined with improved functionality between the microscope and digital cameras provide ideal imaging

Hotline
  • Application
  • Specifications
ECLIPSE L200N
(Episcopic illumination type)
ECLIPSE L200ND
(Diascopic/Episcopic illumination type)
Main body 12V-50W halogen lamp light source built in; power sources for motorized control built in 
Motorized control for nosepiece, light intensity control, aperture diaphragm control 
Nosepiece: Motorized universal sextuple nosepiece
Epi/Dia changeover
Focusing mechanism Cross travel: 29 mm
Coarse: 12.7 mm per rotation (torque adjustable, refocusing mechanism provided)
Fine: 0.1 mm per rotation (in 1 µm increments)
Episcopic illuminator 12V-50W halogen lamp light source built in
Motorized aperture diaphragm (centerable), Fixed field diaphragm (with focus target)
Pinhole slider (optional), Four ø25 mm filters (NCB11, ND16, ND4), Polarizer and Analyzer can be mounted
Diascopic illuminator 12V-50W halogen lamp light source built in
Aperture diaphragm built in
LWD condenser built in
Interface USB x 1, RS232C (for Intensilight) x 1
Eyepiece tubes L2-TT2A ultrawidefield erect-image tilting trinocular eyepiece tube (tilt angle: 0-30 °) FOV: 22/25; Beamsplit ratio 100:0/20:80
L2-TTA ultrawidefield erect-image tilting trinocular eyepiece tube (tilt angle: 0-30 °) FOV: 22/25; Beamsplit ratio 100:0/0:100
LV-TI3 Trinocular (erect image, FOV: 22/25)
Eyepieces CFI eyepiece lens series
Objectives CFI LU/L Plan series
Stages L2-S8A 8 x 8 stage, stroke: 205 x 205 mm (diascopic observation range: 150 x 150 mm)
Coarse/Fine-movement changeover possible
Fixed-position X-Y fine-movement controls
Antistatic mechanism 1000-10 V, within 0.2 sec
Power consumption 1.2 A/90 W
Dimensions Approx. 360 (W) x 860 (D) x 580 (H) mm (at tilt angle 10 °)
Weight Approx. 45 kg (When L2-S8A 8 x 8 stage and L2-TTA eyepiece tube are used)

Eclipse L200N Series – IC inspection microscopes

nikon metrology industrial microscopes upright Eclipse L200N seriesIncorporating CFI60 optics for flawless inspection of 200mm wafers and masks.
Combined with Nikon's superior CFI60 LU/L optical system and an extraordinary new illumination system, this microscope provides images with greater contrast, high resolving power and darkfield images three times brighter than before. Used independently, or in combination with wafer loaders, the L200 series performs exceptionally precise optical inspection of wafers, photo masks, reticles and other substrates.

Applications

  • Antennae
  • Telecom & Electronics
  • Wafers
  • Telescope optics
  • Mobile phones, shavers & watches 
     

 

 
Benefits & features
 

3 Models to Choose From

L200: Offers 200mm wafer and mask inspection capabilities for reflected light illumination defect identification with various observation methods such as brightfield, darkfield, simple polarizing and DIC.

L200ND: Offers 200mm wafer and mask inspection capabilities for both transmitted and relfected light illumination. In addition to the observation methods of the L200N, epi-fluorescence observations including 365nm UV exicitation is possible.


Contamination Safeguards

The bodies of these microscopes are finished with electrostatic discharge coatings to prevent foreign particles from adhering to the microscope. Furthermore, the motorized nosepiece uses a shielded center motor that traps foreign particles inside, preventing them from falling onto the sample.


High Intensity Halogen Illumination

The high intensity 12V-50W halogen illuminator, (LV-LH50PC) provides greater brightnessthat than of a 12V-100W halogen illuminator with half the power consumption. This new lamphouse incorporates a rear mirror and optimized lamp filament size to allow effective and uniform illumination on the pupil plane which is critical in an optical plane.


Improved DIC microscopy

Nikon's CFI LU Plan objectives allow the use of multiple observation techniques, including brightfield, darkfield, and Nomarski DIC using a single objective. For DIC, simply insert a single Nomarski prism into the nosepiece that works for all magnification ranges.


SEMI S2-0200, S8-0600 Compliant Design

Incorporating a SEMI-compliant design, controls and knobs are positioned low and close to the operator while the eyepoint is set at the ideal height for comfortable operation. With the controls located comfortably in the microscope base, hand movement is minimal, allowing concentration on the inspection process. The eyepiece is moved closer to the operator so that he or she can assume a more erect sitting posture. This also positions the operator farther from the stage to provide a more ergonomic and safe viewing position.


Tilting Eyepiece Tube

The eyepiece tube is of the trinocular tilting type, allowing continuous adjustment of the tilt angle from 0° to 30° for viewing at the optimum eyepoint level. The eyepiece also features an ultra-widefield design and has an F.O.V. of 25mm.


Fixed-Position X-Y Fine-Movement Controls

The X-Y fine-movement controls remain in the same position, close to the front, for a comfortable viewing posture regardless of the stage position. In addition, these controls, plus the focus knob, are located close to each other so you can operate both with one hand.


Motorized Nosepiece with Software Control

nikon metrology industrial microscopes upright motorized nosepiece L200NThe motorized universal nosepiece for the L200N series microscope has improved centricity and is three times more durable than conventional models. It also contains an anti flash mechanism to protect the operators eyes when the nosepiece is rotated. The L200A built in motorized nosepiece includes a slot for DIC attachments, features a mechanical click stop and is controlled by software that enables the system to stop precisely at each respective objective position.


CFI60 Optical System

Provide outstandingly clear, sharp images with longer working distances, high numerical aperture (NA) and minimal flare. Signal to background ratios during darkfield observations are three times better than before to provide outstanding high contrast images ideal for high precision observations.


Vibration Isolation

Applying computer-aided engineering (CAE), Nikon increased the rigidity of the L200 series dramatically, making these microscopes three times less susceptible to floor vibrations when compared with conventional equipment. This, in turn, reduces the chance of unwanted blur or image shifts even during high magnification observations. While this superior design increases stability, it also results in a smaller footprint.

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Mr Na In Kang - Korean Manager
Mr Na In Kang - Korean Manager 083.325.1049
Mr Lee Mu Seok - KOREA MANAGER
Mr Lee Mu Seok - KOREA MANAGER 038.313.1048
Mr Khương - Sales Manager
Mr Khương - Sales Manager 086.830.3137
Mr Phúc - Sales Manager
Mr Phúc - Sales Manager 096.815.1813
Mr Huấn - Technical support
Mr Huấn - Technical support 097.917.5569
Mr Thưởng - Sales Excutive
Mr Thưởng - Sales Excutive 097.832.6569
Mr Ngọ - Technical Support
Mr Ngọ - Technical Support 096.776.1171
Mr Tâm - Technical Support
Mr Tâm - Technical Support 086.239.6388
 

 

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