Maximum sample height: 38 mm (when used with LVNU5AI U5AI nosepiece and LV-S32 3x2 stage / LV-S64 6x4 stage)
* 73 mm when used with one column riser 12V50W internal power source for dimmer, coarse and fine adjustment knobs
Left: coarse and fine adjustment / Right: fine adjustment, 40 mm stroke Coarse adjustment: 14 mm/turn (with torque adjustment, refocusing mechanism)
Fine adjustment: 0.1 mm/turn (1 μm/graduation) Stage mounting hole intervals: 70 x 94 (fixed by 4-M4 screw)
LV-S32 3x2 stage (Stroke: 75 x 50 mm with glass plate) ESD compatible
LV-S64 6x4 stage (Stroke: 150 x 100 mm with glass plate) ESD compatible
LV-S6 6x6 stage (Stroke: 150 x 150 mm) ESD compatible
Eyepieces:
CFI eyepiece series
Objective lenses:
Industrial Microscope CFI60-2/CFI60 optical system Objective lens series: Combinations in accordance with the observation method
ESD performance:
1000 to 10V, within 0.2 sec. (excluding certain accessories)
Power consumption:
1.2A/75W
Weight:
Approximately 8.6kg
Specifications LV100NDA
Base unit:
Maximum sample height: 33 mm (when used with LVNU5AI U5AI nosepiece and LV-S32 3x2 stage / LV-S64 6x4 stage)
* 73 mm when used with one column riser 12V50W internal power source for dimmer, coarse and fine adjustment knobs
Left: coarse and fine adjustment / Right: fine adjustment, 40 mm stroke Coarse adjustment: 14 mm/turn (with torque adjustment, refocusing mechanism)
Fine adjustment: 0.1 mm/turn (1 μm/graduation) Stage mounting hole intervals: 70 x 94 (fixed by 4-M4 screw)
Motorized microscope with episcopic/diascopic illumination that enables control of objectives and light intensity from camera control unit and automatically detects observation method
A manual microscope with episcopic/diascopic illumination ,which meets the various needs of observation, inspection, research, and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before mean superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm
Modularized microscope body applicable with various observations and tasks
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
Furthermore, phase contrast and DIC observation with diascopic illumination are also possible.
It supports diverse and advanced research, analysis and inspection.
Compatible observation methods
Brightfield
Darkfield
DIC
Fluorescence
Polarizing
Phase contrast
Two-beam interferometry
Episcopic
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Diascopic
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*Select suitable lens for each observation.
Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
CFI60-2 series offers higher NA and longer working distances than ever before.
Through the combination of the Intelligent Nosepiece LV-NU5I and Nosepiece Adapter LV-INAD, information about the objective in use is detected and displayed in the monitor via the camera control unit. In addition, the information is automatically converted to appropriate calibration data when changing magnification.